Paper
10 March 1999 High-precision positioning stage for microassembly purposes
Manfred Weck, Bernd Petersen
Author Affiliations +
Proceedings Volume 3680, Design, Test, and Microfabrication of MEMS and MOEMS; (1999) https://doi.org/10.1117/12.341267
Event: Design, Test, and Microfabrication of MEMS/MOEMS, 1999, Paris, France
Abstract
In this paper, a LC-SEM will be presented as observation device for micro assembly purposes. Compared to other means of magnification it offers several advantages like, for instance, a large depth of field. A gripper which can be operated inside this LC-SEM has been developed and tested. It can be equipped with an endoscope for additional process observation. Its gripping arms can be changed according to the assembly task. For precise and flexible positioning of the griper a complex 7-axes positioning system has been designed. It can be operated in the LC-SEM too, and offers a tool-center-point movement of the gripper in order to keep all assembly operations in the focus of the SEM. With these devices further study of micro assembly will be possible.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manfred Weck and Bernd Petersen "High-precision positioning stage for microassembly purposes", Proc. SPIE 3680, Design, Test, and Microfabrication of MEMS and MOEMS, (10 March 1999); https://doi.org/10.1117/12.341267
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Scanning electron microscopy

Endoscopes

Optical microscopes

Assembly equipment

Electron beams

Microscopes

Electron microscopes

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