Paper
13 June 1997 Optical and electrical tests of uniformity of rf PCVD carbon coatings
Malgorzata Langer, Piotr Niedzielski
Author Affiliations +
Proceedings Volume 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology; (1997) https://doi.org/10.1117/12.276201
Event: XII Conference on Solid State Crystals: Materials Science and Applications, 1996, Zakopane, Poland
Abstract
Amorphous carbon and nanocrystalline diamond layers are very interesting candidates for active and passive electronic and optoelectronic applications. One well knows that diamond films possess semiconductor properties. Because of their temperature stability, chemical inertness, large energy gap they are very perspective. The principal condition to apply them is not only to gain the high quality of the parameters but also to assure the stability of the obtained films' properties. The films discussed in this paper are deposited by r.f. dense plasma PCVD. To verify the structure quality it is sufficient to make quite easy measurements: ellipsometric ones and breakdown voltage. The structure image, on the level of ultra fine grains can be visible with the aid of atomic force microscope.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Malgorzata Langer and Piotr Niedzielski "Optical and electrical tests of uniformity of rf PCVD carbon coatings", Proc. SPIE 3179, Solid State Crystals in Optoelectronics and Semiconductor Technology, (13 June 1997); https://doi.org/10.1117/12.276201
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KEYWORDS
Carbon

Diamond

Plasma

Electrodes

Optical coatings

Optical testing

Optoelectronics

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