Applicability of electronic speckle pattern interferometry to the characterization of building materials

Massimo Facchini

doi:10.1117/12.250767

18 September 1996 Applicability of electronic speckle pattern interferometry to the characterization of building materials

Massimo Facchini

Author Affiliations +

Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250767
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France

Abstract

In this paper the application of classical tools for the characterization of building materials is criticized and the applicability of optical techniques in this field is investigated. Optical diagnostic techniques are particularly attractive for a non destructive evaluation of a surface's state and the detection of incipient damage. Non contact, high precision measurements and full-field of observation are features that can bring enormous advantages in experimental tests. Electronic Speckle Pattern Interferometry has ben preferred because it allows a real- time inspection of surfaces and is less sensitive to ambient conditions. The observation of fracture propagation, the full-field evaluation of deformations, the early detection of defects can help for a better understanding of the materials. Some experimental results obtained by optical tests are here discussed.

Citation Download Citation

Massimo Facchini "Applicability of electronic speckle pattern interferometry to the characterization of building materials", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250767

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