Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods

Vladimir N. Babentsov; Aleksandr I. Vlasenko; Peter E. Mozol'; Elena P. Kopishinskaya

doi:10.1117/12.226197

3 November 1995 Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods

Vladimir N. Babentsov, Aleksandr I. Vlasenko, Peter E. Mozol', Elena P. Kopishinskaya

Author Affiliations +

Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226197
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

In this paper a complex diagnostic of impurities defects interaction as a result of irradiation by a ruby laser pulse of 20 ns duration has been made. Photoluminescence, photoconductivity, Raman scattering, microscopic and electrophysical methods were used to characterize the deviation from the stoichiometric composition, impurities activation and disactivation, tellurium layer and dislocations network creation. The mechanism of dislocations appearance as shown is mechanical stresses accumulated in laser irradiated area under the threshold of plasticity of the material.

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Vladimir N. Babentsov, Aleksandr I. Vlasenko, Peter E. Mozol', and Elena P. Kopishinskaya "Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226197

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