Residual stress birefringence in ZnSe and multispectral ZnS

Steven P. Rummel; Herman E. Reedy; Gary L. Herrit

doi:10.1117/12.187335

28 September 1994 Residual stress birefringence in ZnSe and multispectral ZnS

Steven P. Rummel, Herman E. Reedy, Gary L. Herrit

Proceedings Volume 2286, Window and Dome Technologies and Materials IV; (1994) https://doi.org/10.1117/12.187335
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Birefringence is an important factor in determining the imaging quality of visible and infrared optical systems. This paper presents residual birefringence data obtained at 0.6328 micrometers and 10.591 micrometers from several ZnSe and multispectral grade ZnS windows. Refractive index inhomogeneity tests were also performed on the samples at 0.6328 micrometers and their results are given. Residual birefringence data at 0.6328 micrometers is compared to data at 10.591 micrometers .

Citation Download Citation

Steven P. Rummel, Herman E. Reedy, and Gary L. Herrit "Residual stress birefringence in ZnSe and multispectral ZnS", Proc. SPIE 2286, Window and Dome Technologies and Materials IV, (28 September 1994); https://doi.org/10.1117/12.187335

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