Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method

Mario Bertolotti; G. L. Liakhou; Roberto Li Voti; Ruo Peng Wang; Concita Sibilia; Vladimir P. Yacovlev

doi:10.1117/12.194337

15 November 1994 Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method

Mario Bertolotti, G. L. Liakhou, Roberto Li Voti, Ruo Peng Wang, Concita Sibilia, Vladimir P. Yacovlev

Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194337
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany

Abstract

The mirror temperature of diode lasers has been measured by means of a photodeflection method. Information on the thermal behavior of the laser during operation is also obtained.

Citation Download Citation

Mario Bertolotti, G. L. Liakhou, Roberto Li Voti, Ruo Peng Wang, Concita Sibilia, and Vladimir P. Yacovlev "Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194337

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