Paper
1 December 1991 Helium neon laser optics: scattered light measurements and process control
Author Affiliations +
Abstract
Output coupler (OC) and high reflector (HR) thin-film coatings and substrates that are employed in 632.8 nm helium-neon (HeNe) lasers are investigated for optical scatter. The measurement of scatter in this paper is in terms of bidirectional reflectance distribution function and calculated total integrated scatter, or BRDF and CTIS, respectively. Laser output power will be briefly reviewed as a function of total scatter loss from the OC and HR. Increasing amounts of loss (scatter), in individual sets of OC's and HR's, reduces the output power of each laser tube from a theoretical optimum output, for the same amount of loss. Sample optics were measured for BRDF and compared with visual microscope inspection. Statistical analysis of many thousands of coated optics provides insight to controlling causes of scatter in the manufacturing process. Here, the average and standard deviation of BRDF scatter data for many optics provide important data for process control. Various scatter data is presented form OC and HR production runs.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce E. Perilloux "Helium neon laser optics: scattered light measurements and process control", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); https://doi.org/10.1117/12.50515
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Bidirectional reflectance transmission function

Optics manufacturing

Scatter measurement

Optical testing

Laser scattering

Helium neon lasers

Optical coatings

RELATED CONTENT


Back to Top