Paper
5 November 2020 Research on error analysis and elimination technology of non-contact measurement technology in anti-vignetting glass detection
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Proceedings Volume 11567, AOPC 2020: Optical Sensing and Imaging Technology; 115673X (2020) https://doi.org/10.1117/12.2580264
Event: Applied Optics and Photonics China (AOPC 2020), 2020, Beijing, China
Abstract
The anti-vignetting glass (AVG) is the key material for super-second and third-generation low-light image intensifiers. With the development of low-light night vision technology, the requirements of high precision and low damage are put forward to AVG. However, traditional measurement methods, such as vernier calipers, micrometers, dial indicators, etc., are all contact measurement, which will inevitably cause damage to AVG during the measurement process. They cannot meet the technical requirements for low damage. Non-contact measurement technology is a non-destructive testing method that realizes the geometric measurement of AVG by writing measurement programs and setting measurement parameters. However, due to the special structure of AVG, the non-contact measurement technology has measurement errors and cannot meet the high-precision measurement requirements. In this paper systematically analyzes the causes of errors in non-contact measurement technology by studying the characteristics of the light source, the difference in light intensity, and the way of grabbing contour edges. Through the error correction technology, the error of the non-contact measurement technology is eliminated, the AVG high-precision and low-damage non-destructive testing is realized.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kaiyu Li, Xueliang Lv, Zijin Li, Jingming Zheng, Yong Sun, Zhenbo Cao, Tiezhu Bo, Sheng Hong, Zhuang Kong, Tianyi Na, and Chen Wang "Research on error analysis and elimination technology of non-contact measurement technology in anti-vignetting glass detection", Proc. SPIE 11567, AOPC 2020: Optical Sensing and Imaging Technology, 115673X (5 November 2020); https://doi.org/10.1117/12.2580264
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KEYWORDS
Light sources

Light

Error analysis

Reflectivity

Glasses

Analytical research

Nondestructive evaluation

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