The surface polishing quality of optical fiber imaging elements directly affects the image quality of image intensifier. In this paper, optical microscope is used to analyze the optical fiber imaging elements with different surface defects. After polishing again under the same process conditions, it is found that the surface polishing defects are reduced by 70%, and the position of the remaining 30% defects remains unchanged. This phenomenon was further studied. The 30% surface defects were observed by laser confocal microscope. The morphology and composition of the defects were analyzed by SEM and EDS. the results showed that the defects were the structure defects of optical fiber in optical fiber imaging elements. In view of the above findings, the low structure defect optical fiber was prepared and the corresponding optical fiber image imaging elements were prepared. Compared with the normal optical fiber imaging elements, the specific causes of the defects and the influence mechanism were analyzed, and the improvement scheme was proposed. The conclusion of this paper has a certain guiding significance for the internal structure optimization and surface polishing quality control of optical fiber imaging elements, and provides theoretical data support.
The aim of this work is the formation of anti-blue light coatings which are suitable for application on 3C products. Atomic layer deposition was used to deposit Al2O3 and TiO2 single layer films onto glass substrates at 250 °C. Optical characterization of the films was conducted to evaluate whether the thickness was suitable for the fabrication of multipair reflective coatings. The refractive indices of the films measured at an optical wavelength of 450 nm were 1.68 (67 nm, Al2O3) and 2.67 (42 nm, TiO2). Al2O3/TiO2 multilayer DBRs with 1.5, 3.5, 5.5 and 7.5 pairs were deposited on glass substrates. The thickness of each layer of Al2O3 and TiO2 films were 63.7 and 49.6 nm in the multilayer structure measured via FE-TEM. When 1.5-pair Al2O3/TiO2 DBRs were deposited on the glass substrate, the films had high transparency, and less reflective effect were observed. As 3.5, 5.5 and 7.5-pair DBRs were deposited on the glass substrates, the Bragg reflection effect became apparent. We found 7.5-pair Al2O3/TiO2 DBRs prepared by ALD had the best central and bandwidth of the Bragg reflection effect for blue light.
The anti-vignetting glass (AVG) is the key material for super-second and third-generation low-light image intensifiers. With the development of low-light night vision technology, the requirements of high precision and low damage are put forward to AVG. However, traditional measurement methods, such as vernier calipers, micrometers, dial indicators, etc., are all contact measurement, which will inevitably cause damage to AVG during the measurement process. They cannot meet the technical requirements for low damage. Non-contact measurement technology is a non-destructive testing method that realizes the geometric measurement of AVG by writing measurement programs and setting measurement parameters. However, due to the special structure of AVG, the non-contact measurement technology has measurement errors and cannot meet the high-precision measurement requirements. In this paper systematically analyzes the causes of errors in non-contact measurement technology by studying the characteristics of the light source, the difference in light intensity, and the way of grabbing contour edges. Through the error correction technology, the error of the non-contact measurement technology is eliminated, the AVG high-precision and low-damage non-destructive testing is realized.
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