Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions (Conference Presentation)

Nicholas Gusken; Alberto Lauri; Yi Li; Takayuki Matsui; Anna Regoutz; Brock G. Doiron; Ryan Bower; Andrei P. Mihai; Rupert F. Oulton; Peter K. Petrov; Lesley F. Cohen; Stefan A. Maier

doi:10.1117/12.2546034

9 March 2020 Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions (Conference Presentation)

Nicholas Gusken, Alberto Lauri, Yi Li, Takayuki Matsui, Anna Regoutz, Brock G. Doiron, Ryan Bower, Andrei P. Mihai, Rupert F. Oulton, Peter K. Petrov, Lesley F. Cohen, Stefan A. Maier

Author Affiliations +

Proceedings Volume 11285, Silicon Photonics XV; 1128514 (2020) https://doi.org/10.1117/12.2546034
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

This Conference Presentation, "Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions" was recorded at Photonics West 2020 held in San Francisco, California, United States.

Conference Presentation

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Nicholas Gusken, Alberto Lauri, Yi Li, Takayuki Matsui, Anna Regoutz, Brock G. Doiron, Ryan Bower, Andrei P. Mihai, Rupert F. Oulton, Peter K. Petrov, Lesley F. Cohen, and Stefan A. Maier "Oxide-enhanced IR hot-carrier-based photo detection in metal thin-film Si junctions (Conference Presentation)", Proc. SPIE 11285, Silicon Photonics XV, 1128514 (9 March 2020); https://doi.org/10.1117/12.2546034

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