Paper
7 October 2019 Mueller Matrix characterization of samples for potential use in clutter rejection and discrimination algorithms
F. Bodrucki, G. Boreman
Author Affiliations +
Proceedings Volume 11161, Technologies for Optical Countermeasures XVI; 111610K (2019) https://doi.org/10.1117/12.2532665
Event: SPIE Security + Defence, 2019, Strasbourg, France
Abstract
Characterization of potentially useful polarization signatures is discussed. We experimentally evaluate a liquid crystal retarder switch used for beamsteering as a function of angle and applied voltage, and compare to a CCR at 633 nm. Distinguishable results between the various measured Mueller matrix elements, angle of incidence, applied voltage and samples tested are shown, which indicates this method may be useful in discriminating between various return signals and background clutter.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Bodrucki and G. Boreman "Mueller Matrix characterization of samples for potential use in clutter rejection and discrimination algorithms", Proc. SPIE 11161, Technologies for Optical Countermeasures XVI, 111610K (7 October 2019); https://doi.org/10.1117/12.2532665
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KEYWORDS
Polarization

Prisms

Silicon

Liquid crystals

Wave plates

Semiconducting wafers

Switches

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