Paper
26 February 2019 Ellipso-polarimetric schemes for improved surface plasmon resonance detection
Ibrahim Watad, Ibrahim Abdulhalim
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Abstract
The majority of commercially available surface plasmon resonance (SPR) sensors rely solely on the detection of the intensity minimum of the reflected signal avoiding the extraction of the polarization properties. Such properties, i.e. the phase difference between polarization components and the azimuthal angle of the polarization ellipse, give sharper responses than the intensity which lead to a better measurement accuracy. Therefore, the lack of extraction of polarization properties in such devices significantly limits their performance. In this work we suggest different configurations of multifunctioning SPR sensing systems that can extract both the normalized reflectivity and the polarization properties simultaneously in the angular and spectral modes. This leads to a significant boost in the performance of existing SPR sensors as multi-parametric functioning systems.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ibrahim Watad and Ibrahim Abdulhalim "Ellipso-polarimetric schemes for improved surface plasmon resonance detection", Proc. SPIE 10912, Physics and Simulation of Optoelectronic Devices XXVII, 109120T (26 February 2019); https://doi.org/10.1117/12.2504380
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Cited by 1 scholarly publication.
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KEYWORDS
Liquid crystals

Polarization

Reflectivity

Metals

Prisms

Polarimetry

Surface plasmons

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