Paper
13 May 2019 Angle dependent scatter in CVD ZnSe and single crystal CaF2 from the infrared through the NIR
M. B. Airola, M. E. Thomas, J. Ma, D. V. Hahn, K. Hibbitts, D. Blaney
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Abstract
The data reported in journals on angle resolved scatter measurements for highly transparent window materials is scarce. An experimental facility with enough sensitivity to measure such low level scatter is described. A dynamic range of at least eight orders of magnitude is required to measure the peak of the specular component down to the random diffuse component far removed from the specular direction. Single crystal CaF2 and polycrystalline CVD ZnSe are measured at wavelengths from the visible to the midwave infrared. The use of thick and thin samples allows the distinction between surface scatterance and bulk scatter.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. B. Airola, M. E. Thomas, J. Ma, D. V. Hahn, K. Hibbitts, and D. Blaney "Angle dependent scatter in CVD ZnSe and single crystal CaF2 from the infrared through the NIR", Proc. SPIE 10985, Window and Dome Technologies and Materials XVI, 1098504 (13 May 2019); https://doi.org/10.1117/12.2519457
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KEYWORDS
Chemical vapor deposition

Ultraviolet radiation

Absorption

Crystals

Infrared radiation

Scatter measurement

Data modeling

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