Dr. Yuan Feng Profile

Dr. Yuan Feng

at Changchun Univ of Science and Technology

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 24 October 2017 Paper

Single higher-order mode ring-shaped VCSEL with surface relief

Xia Wang, Yongqin Hao, Zhiwei Wang, Jianlai Xie, Yonggang Zou, Yuan Feng, Xiaohui Ma

Proceedings Volume 10457, 104571C (2017) https://doi.org/10.1117/12.2284179

KEYWORDS: Vertical cavity surface emitting lasers

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Proceedings Article | 24 October 2017 Paper

A large size vertical cavity surface emitting laser with multiple concentric ring apertures

Zhi-Wei Wang, Yong-Qin Hao, Xin Zhang, Yang Li, Guang-Li Yue, Chang-Ling Yan, Yuan Feng, Xiao-Hui Ma, Guo-Jun Liu

Proceedings Volume 10457, 1045705 (2017) https://doi.org/10.1117/12.2281408

KEYWORDS: Vertical cavity surface emitting lasers, Semiconductor lasers, High power lasers

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Proceedings Article | 7 November 2016 Paper

Study on the etching process GaAs-based VCSEL

Yuan Feng, Guojun Liu, Yongqin Hao, Changling Yan, Jiabin Zhang, Yang Li, Zaijin Li

Proceedings Volume 10141, 101410I (2016) https://doi.org/10.1117/12.2257056

KEYWORDS: Oxidation, Etching, Vertical cavity surface emitting lasers, Corrosion, Wet etching, Aluminum, Scanning electron microscopy, Semiconducting wafers, Gallium, High power lasers

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Proceedings Article | 7 November 2016 Paper

Fabrication of the new structure 980nm VCSEL

Yuan Feng, Guojun Liu, Yongqin Hao, Changling Yan, Jiabin Zhang, Yang Li, Zaijin Li

Proceedings Volume 10141, 101410H (2016) https://doi.org/10.1117/12.2257053

KEYWORDS: Oxidation, Vertical cavity surface emitting lasers, Resistance, Electrodes, Gallium, Aluminum, Semiconducting wafers, Structural design, Lithium, High power lasers

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Proceedings Article | 4 March 2015 Paper

The law of wet oxidation rate in 850nm VCSELs

Yuan Feng, Guojun Liu, Changling Yan, Yongqin Hao, Yong Wang, Peng Lu, Yang Li, Zaijin Li

Proceedings Volume 9521, 95210E (2015) https://doi.org/10.1117/12.2087296

KEYWORDS: Vertical cavity surface emitting lasers, Chemical elements, Semiconducting wafers, Scanning electron microscopy, Gallium, Oxygen, Diffusion, X-rays, Aluminum, Oxidation

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Proceedings Article | 4 March 2015 Paper

Temperature characteristic of 808nm VCSELs with large aperture

Yuan Feng, Dawei Feng, Yongqin Hao, Yong Wang, Changling Yan, Peng Lu, Yang Li

Proceedings Volume 9521, 95210L (2015) https://doi.org/10.1117/12.2087562

KEYWORDS: Vertical cavity surface emitting lasers, Electrodes, Resistance, Temperature metrology, Semiconducting wafers, Gallium arsenide, High power lasers, Continuous wave operation, Aluminum, Oxidation

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Showing 5 of 6 publications

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