Dr. Marco La Manna
Sr. Research Engineer
SPIE Involvement:
Author
Area of Expertise:
Computational Optics , Time-of-Flight Imaging , Signal Processing , Radar Signal Processing
Profile Summary

I am currently collaborating with Prof. Andreas Velten on projects related to applied computational optics and time-of-flight imaging. More specifically, I am working on improved reconstruction algorithms for non-line of sight imaging, collecting data from physical experimental setups and also investigating on a better theoretical understanding of multi-bounce light transport.
I obtained my PhD in electrical engineering from Michigan Technological University in 2016. I gained strong analytical problem solving skills and also programming skills to verify the theoretical results through simulation-based scenarios.
Publications (4)

Proceedings Article | 13 May 2019 Presentation
Proceedings Volume 10990, 1099005 (2019) https://doi.org/10.1117/12.2519002
KEYWORDS: Imaging systems, Detection and tracking algorithms, Target recognition, Non-line-of-sight propagation, Relays, Photons, Cameras, Radar, LIDAR, Target detection

Proceedings Article | 4 October 2018 Presentation + Paper
Proceedings Volume 10799, 1079903 (2018) https://doi.org/10.1117/12.2500659
KEYWORDS: Sensors, Single photon, Imaging systems, Non-line-of-sight propagation, Picosecond phenomena, Cameras, Silicon, Avalanche photodiodes, Ranging, Data acquisition

Proceedings Article | 15 May 2018 Presentation
Proceedings Volume 10666, 106660R (2018) https://doi.org/10.1117/12.2305053
KEYWORDS: Stereoscopy, Image restoration, Transmitters, Receivers, Non-line-of-sight propagation, Photons, 3D image reconstruction, Computed tomography, LIDAR, Image transmission

Proceedings Article | 29 September 2017 Presentation
Marco La Manna, Eric Breitbach, Jonathan Jackson, Fiona Kine, Andreas Velten
Proceedings Volume 10394, 103940A (2017) https://doi.org/10.1117/12.2275715
KEYWORDS: Reconstruction algorithms, Image processing, Computational imaging, Optical properties, Image acquisition, Time metrology, 3D image processing

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