Zijun Li
at Xi'an Jiaotong Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 March 2022 Paper
Proceedings Volume 12169, 12169D3 (2022) https://doi.org/10.1117/12.2627416
KEYWORDS: Clouds, Structured light, 3D metrology, Precision measurement, Cameras, Metals, Measurement devices, Reflection, Phase shifts, Optical testing

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