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Zhigang Jia
at Tianjin Univ
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Publications (1)
Proceedings Article | 31 January 2013 Paper
Modeling and analysis of a scanning electrostatic force microscope for surface profile measurement
Zhigang Jia, Shigeaki Goto, Keiichiro Hosobuchi, So Ito, Yuki Shimizu, Wei Gao
Proceedings Volume 8759, 875914 (2013) https://doi.org/10.1117/12.2014460
KEYWORDS: Fused deposition modeling, Finite difference methods, Statistical modeling, Microscopes, Capacitance, Scanners, Spherical lenses, Prototyping, Computer simulations, Optical spheres
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