A 2D fringe pattern is presented for projected fringe profilometry in the tele-centric system. Compared with the methods which embeds multiple frequencies in one pattern, the proposed one-shot method is more tolerant to low signal-to-noise ratios and more reliable for surface with large color or reflectance variation.
A one-shot fringe projection scheme with a 2D fringe pattern for tele-centric Fourier transform profilometry is presented. Even though the size of the inspected object is so small that the surface is not fully projected by one fringe, unwrapping can be performed without ambiguity.
A one-shot technique for profile measurements is presented. A sinusoidal fringe pattern embedded with one-dimensional pulses is used to illuminate the inspected object. The pattern projected on the inspected object is observed by a CCD camera at another view angle. The pulse-encoded fringe pattern provides additional information to identify the fringe order. Even though the surface color or reflectivity varies periodically with positions, it distinguishes the fringe order very well.
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