Dr. Yuming Wang
at Huazhong Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 February 2005 Paper
Yajie Ma, Zongkai Yang, Yuming Wang, Jingwen Chen
Proceedings Volume 5626, (2005) https://doi.org/10.1117/12.575678
KEYWORDS: Line edge roughness, Switching, Receivers, Internet, Switches, Relays, Network architectures, Forward error correction, Chromium, Electronics engineering

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