In this work, we report an integrated configurable device, which successfully solved the synchronization problem of signals and provided the possibility for the “closed-loop” control of measurement. The digital part of the device is completely realized in the field programmable gate array (FPGA). According to the requirements of measuring arbitrary waveform generator(AWG) and high accuracy in the design of high-performance lock-in amplifier(LIA). the integrated and configurable design has more portable advantages in future practical applications. The device is suitable for measuring devices with quantum sensing and can be used in other measuring systems with weak signal. We design the arbitrary waveform generator and the lock-in amplifier in a digital circuit, and control the entire measurement system under the same clock, which can solve the problem of signal synchronization. The bandwidth of the output dual-channel arbitrary waveform generator can reach 30 MHz, The 4 V voltage signal is output through the operational amplifier and the signal is output as an analog quantity through a 30MHz low-pass filter. The designed arbitrary waveform generator can provide a reference signal for the lock-in amplifier. The lock-in amplifier adopts a double-channel orthogonal design, and finally uses the coordinate rotation method to calculate the final result.
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