Dr. Yongkun Sin
Senior Scientist at Aerospace Corp
SPIE Involvement:
Author
Publications (42)

Proceedings Article | 13 March 2024 Paper
Yongkun Sin, Jesse Theiss, Michael Huang, Emily Tang, Jeffrey Childs, In-Tae Bae, Adam Bushmaker
Proceedings Volume 12904, 129040D (2024) https://doi.org/10.1117/12.3000490
KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Failure analysis, Accelerated life testing, Quantum wells, Photocurrent, Indium gallium arsenide

Proceedings Article | 12 March 2024 Paper
Yongkun Sin, Cassidy Feltenberger, Dicky Daniel, Matthew Voegtle, In-Tae Bae
Proceedings Volume 12867, 128670I (2024) https://doi.org/10.1117/12.3000500
KEYWORDS: Electroluminescence, Quantum wells, Accelerated life testing, Quantum dots, High power lasers

Proceedings Article | 15 March 2023 Paper
Yongkun Sin, Jesse Theiss, Michael Huang, Jeffrey Childs, In-Tae Bae, Zachary Lingley
Proceedings Volume 12439, 124390D (2023) https://doi.org/10.1117/12.2647286
KEYWORDS: Vertical cavity surface emitting lasers, Failure analysis, Reliability, Transmission electron microscopy, Quantum wells, Indium gallium arsenide, Accelerated life testing, Satellites

Proceedings Article | 14 March 2023 Paper
Yongkun Sin, In-Tae Bae, Zachary Lingley
Proceedings Volume 12403, 124030C (2023) https://doi.org/10.1117/12.2647287
KEYWORDS: Transmission electron microscopy, Electroluminescence, Quantum wells, Quantum processes, Quantum dots, High power lasers, Quantum confinement

Proceedings Article | 5 March 2022 Paper
Yongkun Sin, Dmitry Veksler, Patrick Edwards, Miles Brodie, Scott Sitzman, Zachary Lingley
Proceedings Volume 12001, 120010E (2022) https://doi.org/10.1117/12.2606276
KEYWORDS: Field effect transistors, Gallium nitride, Transmission electron microscopy, Palladium, Failure analysis, Metals, Gold, Reliability, Nickel, Ion beams

Showing 5 of 42 publications
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