Dr. Yingyan Huang
President at OptoNet Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 February 2009 Paper
Boyang Liu, Ki Young Kim, Yingyan Huang, Seng-Tiong Ho
Proceedings Volume 7218, 72180Q (2009) https://doi.org/10.1117/12.808635
KEYWORDS: Image resolution, Finite-difference time-domain method, Near field scanning optical microscopy, Photodetectors, Semiconductors, Nanoimaging, Near field, Electrodes, Metals, Optical simulations

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