Yi Ta Lee
at National Taiwan Normal Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 September 2014 Paper
Proceedings Volume 9200, 92001J (2014) https://doi.org/10.1117/12.2064307
KEYWORDS: Inspection, 3D metrology, Fringe analysis, CCD cameras, Shape analysis, Refractive index, 3D image processing, Lenses, Fourier transforms, Light sources

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