Dr. Yanwei Liu
at KLA-Tencor California
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 6 October 2011 Paper
Proceedings Volume 8140, 81400W (2011) https://doi.org/10.1117/12.892927
KEYWORDS: Microscopes, X-rays, Imaging systems, Spatial resolution, X-ray lasers, Diffraction gratings, Image resolution, Modulation transfer functions, Diffraction, Gas lasers

Proceedings Article | 29 September 2009 Paper
Proceedings Volume 7451, 74510I (2009) https://doi.org/10.1117/12.826419
KEYWORDS: Microscopes, Zone plates, Extreme ultraviolet lithography, Objectives, Photomasks, Spatial resolution, X-ray lasers, Microscopy, Modulation, Modulation transfer functions

Proceedings Article | 18 March 2009 Paper
F. Brizuela, Y. Wang, C. Brewer, F. Pedaci, W. Chao, E. Anderson, Y. Liu, K. Goldberg, P. Naulleau, P. Wachulak, M. Marconi, D. Attwood, J. Rocca, C. Menoni
Proceedings Volume 7271, 72713F (2009) https://doi.org/10.1117/12.814320
KEYWORDS: Microscopes, Spatial resolution, Extreme ultraviolet lithography, Zone plates, Photomasks, Extreme ultraviolet, Image resolution, Inspection, Objectives, Modulation transfer functions

Proceedings Article | 19 February 2008 Paper
Proceedings Volume 6883, 68830V (2008) https://doi.org/10.1117/12.769892
KEYWORDS: Zone plates, X-ray microscopy, Spiral phase plates, Nickel, X-rays, Image filtering, Microscopy, Objectives, Electron beam lithography, X-ray optics

Proceedings Article | 23 March 2006 Paper
Proceedings Volume 6151, 61510X (2006) https://doi.org/10.1117/12.656588
KEYWORDS: Extreme ultraviolet, Zone plates, Spatial resolution, Microscopes, Photomasks, Imaging systems, Extreme ultraviolet lithography, Inspection, Plasma, Reflectivity

Showing 5 of 9 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top