X-ray CCD operated onboard satellite are contaminated by outgas from organic material used in satellites. This contamination causes a significant reduction in the detection sensitivity of X-ray detectors.
In order to prevent such contamination to the Back-Illuminated CCD (BI-CCD) of the Soft X-ray Imager
(SXI) onboard ASTRO-H, we have developed a Contamination Blocking Filter (CBF), which consists of ~30nm thick Aluminum and ~200nm thick Polyimide. The CBF is be placed on the top of the CCD camera hood and is required to have a high X-ray transmission in order to take advantage of the high detection efficiency of BI-CCD.
We measured the X-ray transmission of three flight candidates of the CBF last October at the SPring-8 and obtained the X-ray transmission of three CBFs in the soft X-ray energy from 0.2 to 1.8 keV which covers the absorption edges around C-K, N-K, O-K, and Al-K including X-ray absorption fine structure (XAFS). In these measurements, we found three CBFs have high X-ray transmission below 2ke V, e.g. ~70% at around 0.5 keV, and determined the thickness of Al and Polyimide to be 220 nm and ~50 nm, respectively. We will calculate the response function of SXI including these results.
Extreme ultraviolet lithography (EUVL) is a leading technology to succeed optical lithography for high volume
production of 22 nm node and beyond. One of the top risks for EUVL is the readiness of defect-free masks, especially
the availability of Mo/Si mask blanks with acceptable defect level. Fast, accurate and repeatable defect inspection of
substrate and multi-layer (ML) blank is critical for process development by both blank suppliers and mask makers. In
this paper we report the results of performance improvements on a latest generation mask blank inspection tool from
Lasertec Corporation; the MAGICS M7360 at Intel Corporation's EUV Mask Pilot Line. Inspection repeatability and
sensitivity for both quartz substrates (Qz) and ML blanks are measured and compared with the previous Phase I tool
M7360. Preliminary results of high speed scan correction mirror implementation are also presented
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