Prof. Wenhui Wang
at Tsinghua Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 October 2021 Poster + Presentation + Paper
Proceedings Volume 11904, 1190417 (2021) https://doi.org/10.1117/12.2601968
KEYWORDS: Imaging systems, Tomography, Refractive index, 3D image processing, Phase measurement, Atomic force microscopy, Diffraction, Microfluidics, Diffraction gratings, 3D metrology

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