Toshiyuki Yokosuka
Researcher at Hitachi Ltd.
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 1295520 (2024) https://doi.org/10.1117/12.3007173
KEYWORDS: Electric fields, Selenium, Monte Carlo methods, Tunable filters, Statistical analysis, Scanning electron microscopy, Inspection, Sensors, Semiconductors, Scattering

Proceedings Article | 26 May 2022 Poster + Paper
Proceedings Volume 12053, 120531Y (2022) https://doi.org/10.1117/12.2613955
KEYWORDS: Scanning electron microscopy, Neural networks, Monte Carlo methods, Sensors, Evolutionary algorithms, Computer simulations, Image processing, Algorithm development, Visibility, Convolutional neural networks

Proceedings Article | 13 March 2018 Paper
Chahn Lee, Toshiyuki Yokosuka, Hideyuki Kazumi
Proceedings Volume 10585, 105852E (2018) https://doi.org/10.1117/12.2297371
KEYWORDS: Scattering, Solids, Diffusion, Clouds, Monte Carlo methods, Scanning electron microscopy, Metals, Copper, Particles, 3D modeling

Proceedings Article | 28 March 2017 Presentation + Paper
Toshimasa Kameda, Satoshi Takada, Makoto Suzuki, Toshiyuki Yokosuka, Sergey Borisov, Sergey Babin
Proceedings Volume 10145, 101451I (2017) https://doi.org/10.1117/12.2257661
KEYWORDS: Monte Carlo methods, Scanning electron microscopy, Image processing, Crystals, Electrons, Metrology, Inspection, Manufacturing, Scattering, Silica, Selenium, Laser scattering, Semiconductors

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top