Thorsten Giese
at Fraunhofer ISIT
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 28 March 2021 Presentation + Paper
Proceedings Volume 11765, 1176503 (2021) https://doi.org/10.1117/12.2579695
KEYWORDS: Microelectromechanical systems, Mirrors, RGB color model, Projection systems, Laser sources, Control systems, Waveguides, Virtual reality, Video, Prototyping

Proceedings Article | 28 February 2020 Presentation + Paper
F. Senger, J. Albers, U. Hofmann, G. Piechotta, T. Giese, F. Heinrich, T. von Wantoch, S. Gu-Stoppel
Proceedings Volume 11293, 1129305 (2020) https://doi.org/10.1117/12.2542802
KEYWORDS: Microelectromechanical systems, Mirrors, Semiconducting wafers, Wafer bonding, Actuators, Aluminum nitride, Headlamps, Glasses, Silicon, Molybdenum

Proceedings Article | 22 May 2015 Paper
Proceedings Volume 9495, 94950S (2015) https://doi.org/10.1117/12.2175855
KEYWORDS: LIDAR, Scanners, Microelectromechanical systems, Avalanche photodetectors, Laser scanners, 3D scanning, Mirrors, Sensors, Analog electronics, Solids

Proceedings Article | 22 May 2015 Paper
Proceedings Volume 9495, 94950F (2015) https://doi.org/10.1117/12.2175851
KEYWORDS: LIDAR, Electronics, Microelectromechanical systems, Scanners, Modulation, Laser scanners, 3D scanning, Signal detection, Analog electronics, Solids

Proceedings Article | 14 February 2011 Paper
U. Hofmann, C. Eisermann, H.-J. Quenzer, J. Janes, C. Schroeder, O. Schwarzelbach, B. Jensen, L. Ratzmann, T. Giese, F. Senger, J. Hagge, M. Weiss, B. Wagner, W. Benecke
Proceedings Volume 7930, 79300R (2011) https://doi.org/10.1117/12.878676
KEYWORDS: Mirrors, Microelectromechanical systems, Semiconducting wafers, Glasses, Scanners, Silicon, Wafer bonding, Packaging, Electrodes

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