Dr. Thomas M. Wood Profile

Dr. Thomas M. Wood

Postdoc

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Author

Publications (4)

SPIE Journal Paper | 10 September 2013

Combination of guided mode and photometric optical metrology methods for precise determination of refractive index dispersion: application to polymer blend and ceramic thin films for gas sensors

Thomas Wood, Judikaël Le Rouzo, François Flory, Paul Coudray, Valmor Mastelaro, Pedro Pelissari, Sérgio Zilio

OE, Vol. 52, Issue 09, 094104, (September 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.9.094104

KEYWORDS: Refractive index, Dispersion, Polymers, Ceramics, Thin films, Ellipsometry, Iron, Polymer thin films, Temperature metrology, Polarization

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Proceedings Article | 25 October 2012 Paper

Comparison of refractive indices measured by m-lines and ellipsometry: application to polymer blend and ceramic thin films for gas sensors

Thomas Wood, Judikaël Le Rouzo, François Flory, Paul Coudray, Valmor Mastelaro, Pedro Pelissari, Sérgio Zilio

Proceedings Volume 8466, 84660T (2012) https://doi.org/10.1117/12.928693

KEYWORDS: Refractive index, Ellipsometry, Dispersion, Ceramics, Polymers, Iron, Thin films, Temperature metrology, Polymer thin films, Prisms

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Proceedings Article | 11 October 2012 Paper

Innovative guided mode method for measuring the penetration depth in partially exposed photoresist layers

Thomas Wood, Vincent Brissonneau, Jean-Baptiste Brückner, Gérard Berginc, François Flory, Judikaël Le Rouzo, Ludovic Escoubas

Proceedings Volume 8486, 84860Z (2012) https://doi.org/10.1117/12.928692

KEYWORDS: Photoresist materials, Refractive index, Prisms, Thin films, Radio propagation, Ultraviolet radiation, Glasses, Nondestructive evaluation, Interfaces, Coating

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Proceedings Article | 1 October 2011 Paper

Wavelength and temperature dispersion of refractive index of thin films

Thomas Wood, Judikaël Le Rouzo, François Flory, Ludovic Escoubas, Paul Coudray

Proceedings Volume 8172, 81720I (2011) https://doi.org/10.1117/12.898524

KEYWORDS: Refractive index, Prisms, Thin films, Temperature metrology, Polymers, Dispersion, Photorefractive polymers, Interfaces, Silicon, Silicon films

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