Dr. Stephan Waldner
Senior Scientist at Evatec AG
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 24 June 2024 Presentation + Paper
S. Schwyn Thöny, M. Bärtschi, M. Batzer, M. Baselgia, R. Gmünder, A. Sharma, T. Vermeij, X. Maeder, S. Waldner
Proceedings Volume 13020, 1302007 (2024) https://doi.org/10.1117/12.3016637
KEYWORDS: Refractive index, Tantalum, Absorption, Magnetrons, Coating thickness, Sputter deposition, Design, Quantization, Optical coatings, Antireflective coatings

Proceedings Article | 24 November 2023 Presentation
Proceedings Volume PC12726, PC127260N (2023) https://doi.org/10.1117/12.2682100
KEYWORDS: Sputter deposition, Silica, Tunable filters, Silicon, Refractive index, Manufacturing, Magnetrons, Absorption, Optics manufacturing, Optical coatings

Proceedings Article | 28 September 2021 Presentation + Paper
Silvia Schwyn Thoeny, Daniel Schachtler, Stephan Waldner, Thomas Frei, Manuel Baertschi
Proceedings Volume 11872, 118720O (2021) https://doi.org/10.1117/12.2597085
KEYWORDS: Coating, Error analysis, Camera shutters, Optical simulations, Neodymium, Global system for mobile communications, Data processing, Tolerancing, Signal processing, Reflectivity

Proceedings Article | 4 October 2011 Paper
Proceedings Volume 8168, 81681H (2011) https://doi.org/10.1117/12.896398
KEYWORDS: Transmittance, Resistance, Diffractive optical elements, Oxygen, Refractive index, Plasma, Surface roughness, Absorption, Reflectivity, Thin films

Proceedings Article | 17 August 1999 Paper
Stephan Waldner, Stefan Brem
Proceedings Volume 3745, (1999) https://doi.org/10.1117/12.357771

Showing 5 of 7 publications
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