Dr. Stefan P. Hau-Riege Profile

Dr. Stefan P. Hau-Riege

Physicist at Lawrence Livermore National Lab

SPIE Involvement:

Author | Editor

Proceedings Article | 5 June 2018 Paper

Aperiodic x-ray multilayer interference coatings with high reflectance and large field of view

Catherine Burcklen, Tom Pardini, Jennifer Alameda, Jeff Robinson, Eberhard Spiller, Chris Walton, Paul Mirkarimi, Stefan Hau-Riege, Regina Soufli

Proceedings Volume 10691, 106910U (2018) https://doi.org/10.1117/12.2314257

KEYWORDS: Reflectivity, Multilayers, Silicon, Interfaces, X-rays, Molybdenum, Silicon carbide, Data modeling, Systems modeling

Read Abstract +

Proceedings Article | 21 June 2017 Presentation

Non-thermal damage to lead tungstate induced by intense short-wavelength laser radiation (Conference Presentation)

Vojtech Vozda, Pavel Boháček, Tomáš Burian, Jaromir Chalupský, Vera Hájková, Libor Juha, Ludek Vyšín, Jérôme Gaudin, Philip Heimann, Stefan Hau-Riege, Marek Jurek, Dorota Klinger, Jacek Krzywinski, Marc Messerschmidt, Stefan Moeller, Robert Nagler, Jerzy Pelka, Michael Rowen, William Schlotter, Michele Swiggers, Harald Sinn, Ryszard Sobierajski, Kai Tiedtke, Sven Toleikis, Thomas Tschentscher, Joshua Turner, Hubertus Wabnitz, Art Nelson, Maria Kozlova, Sam Vinko, Thomas Whitcher, Thomas Dzelzainis, Oldrich Renner, Karel Saksl, Roland Fäustlin, Ali Khorsand, Marta Fajardo, Bianca Iwan, Jakob Andreasson, Janos Hajdu, Nicusor Timneanu, Justin Wark, David Riley, Richard Lee, Mitsuru Nagasono, Makina Yabashi

Proceedings Volume 10236, 102360G (2017) https://doi.org/10.1117/12.2270944

KEYWORDS: Physics, Stanford Linear Collider, Free electron lasers, Lead, Photons, States of matter, Materials processing, Electrons, Analytical research, Raman spectroscopy

Read Abstract +

Proceedings Article | 22 September 2015 Paper

The MEL-X project at the Lawrence Livermore National Laboratory: a mirror-based delay line for x-rays

Tom Pardini, Randy Hill, Todd Decker, Jennifer Alameda, Regina Soufli, Andy Aquila, Serge Guillet, Sébastien Boutet, Stefan Hau-Riege

Proceedings Volume 9589, 95890T (2015) https://doi.org/10.1117/12.2186796

KEYWORDS: X-rays, Mirrors, Laser beam diagnostics, Liquid crystal lasers, Iridium, Coating, Zerodur, Polishing, Wavefronts, Free electron lasers

Read Abstract +

Proceedings Article | 9 September 2015 Paper

Calibration results for first NIF Kirkpatrick-Baez microscope

Nicolai Brejnholt, Jay Ayers, Thomas McCarville, Tom Pardini, Louisa Pickworth, David Bradley, Todd Decker, Stefan Hau-Riege, Randal Hill, Michael Pivovaroff, Regina Soufli, Julia Vogel, Chris Walton

Proceedings Volume 9591, 95910J (2015) https://doi.org/10.1117/12.2187150

KEYWORDS: Mirrors, Spatial resolution, National Ignition Facility, Calibration, Multilayers, X-rays, X-ray imaging, Sensors, Reflectivity, Microscopes

Read Abstract +

Proceedings Article | 8 October 2014 Paper

Silicon single crystal as back-reflector for high-intensity hard x-rays

Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Doeppner, Luke Fletcher, Dennis Gardner, Randy Hill, Mark Hunter, Jacek Krzywinski, Marc Messerschmidt, Arthur Pak, Florian Quirin, Klaus Sokolowski-Tinten, Garth Williams, Stefan Hau-Riege

Proceedings Volume 9210, 92100D (2014) https://doi.org/10.1117/12.2061087

KEYWORDS: Silicon, Crystals, X-rays, Hard x-rays, Liquid crystal lasers, Diodes, Prototyping, Mirrors, Semiconducting wafers, Laser crystals

Read Abstract +

Proceedings Article | 10 September 2014 Paper

Engineering precision relocation capability into a large-cantilevered telescoping diagnostic for a Kirkpatrick Baez x-ray Optic

M. Ayers, L. Pickworth, T. Decker, R. Hill, T. Pardini, T. McCarville, N. Shingleton, C. Smith, C. Bailey, P. Bell, D. Bradley, N. Brejnholt, S. Hau-Riege, M. Pivovaroff, P. Mirkarimi, M. Vitalich, J. Vogel, C. Walton, J. Kilkenny

Proceedings Volume 9211, 92110C (2014) https://doi.org/10.1117/12.2065253

KEYWORDS: Mirrors, Diagnostics, National Ignition Facility, X-rays, Digital Light Processing, X-ray imaging, Image filtering, Optical alignment, Microscopes, Sensors

Read Abstract +

Proceedings Article | 6 August 2013 Paper

Development, experimental performance and damage properties of x-ray optics for the LCLS free-electron laser

Regina Soufli, Mónica Fernández-Perea, Jacek Krzywinski, David Rich, Sherry Baker, Jeff Robinson, Stefan Hau-Riege, Eric Gullikson, Valeriy Yashchuk, Wayne McKinney, Philip Heimann, William Schlotter, Michael Rowen, Paul Montanez, Sébastien Boutet

Proceedings Volume 8777, 877702 (2013) https://doi.org/10.1117/12.2019197

KEYWORDS: Liquid crystal lasers, Coating, Mirrors, X-rays, Reflectivity, Free electron lasers, X-ray optics, Atomic force microscopy, Carbon, Silicon carbide

Read Abstract +

Proceedings Article | 19 October 2012 Paper

Profiling structured beams using injected aerosols

N. Loh, Dmitri Starodub, Lukas Lomb, Christina Hampton, Andrew Martin, Raymond Sierra, Anton Barty, Andrew Aquila, Joachim Schulz, Jan Steinbrener, Robert Shoeman, Stephan Kassemeyer, Christoph Bostedt, John Bozek, Sascha Epp, Benjamin Erk, Robert Hartmann, Daniel Rolles, Artem Rudenko, Benedikt Rudek, Lutz Foucar, Nils Kimmel, Georg Weidenspointner, Günther Hauser, Peter Holl, Emanuele Pedersoli, MengNing Liang, Mark Hunter, Lars Gumprecht, Nicola Coppola, Cornelia Wunderer, Heinz Graafsman, Filipe R. N. Maia, Tomas Ekeberg, Max Hantke, Holger Fleckenstein, Helmut Hirsemann, Karol Nass, Thomas White, Herbert Tobias, George Farquar, W. Henry Benner, Stefan Hau-Riege, Christian Reich, Andreas Hartmann, Heike Soltau, Stefano Marchesini, Sasa Bajt, Miriam Barthelmess, Lothar Strueder, Joachim Ullrich, Philip Bucksbaum, Keith Hodgson, Mathias Frank, Ilme Schlichting, Henry Chapman, Michael Bogan

Proceedings Volume 8504, 850403 (2012) https://doi.org/10.1117/12.930075

KEYWORDS: Optical spheres, Free electron lasers, Diffraction, Sensors, Photons, Profiling, X-rays, Wavefronts, Aerosols, Scattering

Read Abstract +

Proceedings Article | 21 May 2011 Paper

Single particle imaging with soft x-rays at the Linac Coherent Light Source

Andrew Martin, Jakob Andreasson, Andrew Aquila, Saša Bajt, Thomas R. Barends, Miriam Barthelmess, Anton Barty, W. Henry Benner, Christoph Bostedt, John Bozek, Phillip Bucksbaum, Carl Caleman, Nicola Coppola, Daniel DePonte, Tomas Ekeberg, Sascha Epp, Benjamin Erk, George Farquar, Holger Fleckenstein, Lutz Foucar, Matthias Frank, Lars Gumprecht, Christina Hampton, Max Hantke, Andreas Hartmann, Elisabeth Hartmann, Robert Hartmann, Stephan Hau-Riege, Günther Hauser, Peter Holl, André Hoemke, Olof Jönsson, Stephan Kassemeyer, Nils Kimmel, Maya Kiskinova, Faton Krasniqi, Jacek Krzywinski, Mengning Liang, Ne-Te Duane Loh, Lukas Lomb, Filipe R. N. Maia, Stefano Marchesini, Marc Messerschmidt, Karol Nass, Duško Odic, Emanuele Pedersoli, Christian Reich, Daniel Rolles, Benedikt Rudek, Artem Rudenko, Carlo Schmidt, Joachim Schultz, M. Marvin Seibert, Robert Shoeman, Raymond Sierra, Heike Soltau, Dmitri Starodub, Jan Steinbrener, Francesco Stellato, Lothar Strüder, Martin Svenda, Herbert Tobias, Joachim Ullrich, Georg Weidenspointner, Daniel Westphal, Thomas White, Garth Williams, Janos Hajdu, Ilme Schlichting, Michael Bogan, Henry Chapman

Proceedings Volume 8078, 807809 (2011) https://doi.org/10.1117/12.886754

KEYWORDS: Diffraction, Particles, X-rays, Light sources, Sensors, Liquid crystal lasers, X-ray imaging, X-ray diffraction, Coherence imaging, Free electron lasers

Read Abstract +

Proceedings Article | 19 May 2011 Paper

X-ray laser-induced ablation of lead compounds

V. Hájková, L. Juha, P. Boháček, T. Burian, J. Chalupský, L. Vyšín, J. Gaudin, P. Heimann, S. Hau-Riege, M. Jurek, D. Klinger, J. Pelka, R. Sobierajski, J. Krzywinski, M. Messerschmidt, S. Moeller, B. Nagler, M. Rowen, W. Schlotter, M. Swiggers, J. Turner, S. Vinko, T. Whitcher, J. Wark, M. Matuchová, S. Bajt, H. Chapman, T. Dzelzainis, D. Riley, J. Andreasson, J. Hajdu, B. Iwan, N. Timneanu, K. Saksl, R. Fäustlin, A. Singer, K. Tiedtke, S. Toleikis, I. Vartaniants, H. Wabnitz

Proceedings Volume 8077, 807718 (2011) https://doi.org/10.1117/12.890134

KEYWORDS: X-rays, Liquid crystal lasers, Laser ablation, Lead, Free electron lasers, Signal attenuation, Extreme ultraviolet, X-ray lasers, Laser damage threshold, Polymethylmethacrylate

Read Abstract +

Proceedings Article | 5 May 2011 Paper

Lifetime and damage threshold properties of reflective x-ray coatings for the LCLS free-electron laser

Regina Soufli, Mónica Fernández-Perea, Stefan Hau-Riege, Sherry Baker, Jeff Robinson, Eric Gullikson, John Bozek, Nicholas Kelez, Sebastien Boutet

Proceedings Volume 8077, 807702 (2011) https://doi.org/10.1117/12.887747

KEYWORDS: Mirrors, Liquid crystal lasers, X-rays, Reflectivity, Free electron lasers, Silicon carbide, Laser damage threshold, Silicon, Atomic force microscopy, Hard x-rays

Read Abstract +

Proceedings Article | 18 May 2009 Paper

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

J. Cihelka, L. Juha, J. Chalupský, F. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, N. Timneanu

Proceedings Volume 7361, 73610P (2009) https://doi.org/10.1117/12.822766

KEYWORDS: Aluminum, Plasma, Silicon, Ions, Free electron lasers, Copper, Chemical species, Spectroscopy, Mirrors, Emission spectroscopy

Read Abstract +

Proceedings Article | 18 May 2009 Paper

Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors

Regina Soufli, Sherry Baker, Jeff Robinson, Eric Gullikson, Tom McCarville, Michael Pivovaroff, Peter Stefan, Stefan Hau-Riege, Richard Bionta

Proceedings Volume 7361, 73610U (2009) https://doi.org/10.1117/12.823836

KEYWORDS: Mirrors, Silicon carbide, Liquid crystal lasers, Reflectivity, Free electron lasers, X-rays, Silicon, Sputter deposition, Thin film coatings, Argon

Read Abstract +

Proceedings Article | 18 May 2009 Paper

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

J. Chalupský, L. Juha, V. Hájková, J. Cihelka, L. Vysin, J. Gautier, J. Hajdu, S. Hau-Riege, M. Jurek, J. Krzywinski, Ri. London, E. Papalazarou, J. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, C. Valentin, H. Wabnitz, P. Zeitoun

Proceedings Volume 7361, 736108 (2009) https://doi.org/10.1117/12.822297

KEYWORDS: Polymethylmethacrylate, Laser ablation, X-rays, Solids, Atomic force microscopy, X-ray lasers, Chemical species, Signal attenuation, Gaussian beams, Surface roughness

Read Abstract +

Proceedings Article | 18 May 2009 Paper

Interaction of intense ultrashort XUV pulses with silicon

R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hakova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. Hau-Reige, R. London

Proceedings Volume 7361, 736107 (2009) https://doi.org/10.1117/12.822152

KEYWORDS: Extreme ultraviolet, Silicon, Atomic force microscopy, Free electron lasers, Laser damage threshold, Optical microscopy, Sensors, Femtosecond phenomena, Absorption, Crystals

Read Abstract +

Proceedings Article | 18 May 2007 Paper

Multilayers for next-generation x-ray sources

S. Bajt, H. Chapman, E. Spiller, S. Hau-Riege, J. Alameda, A. Nelson, C. Walton, B. Kjornrattanawanich, A. Aquila, F. Dollar, E. Gullikson, C. Tarrio, S. Grantham

Proceedings Volume 6586, 65860J (2007) https://doi.org/10.1117/12.724786

KEYWORDS: Reflectivity, Mirrors, Multilayers, Free electron lasers, Silicon, X-ray optics, X-rays, X-ray sources, Coating, Optical components

Read Abstract +

Proceedings Article | 18 May 2007 Paper

Damage-resistant single-pulse optics for x-ray free electron lasers

Stefan Hau-Riege, Richard London, Michael Bogan, Henry Chapman, Magnus Bergh

Proceedings Volume 6586, 65860T (2007) https://doi.org/10.1117/12.723994

KEYWORDS: Singular optics, Silicon, Mirrors, Free electron lasers, X-ray optics, X-rays, Multilayers, Laser damage threshold, Reflectivity, Optical spheres

Read Abstract +

Proceedings Article | 16 June 2003 Paper

Defect repair for extreme-ultraviolet lithography (EUVL) mask blanks

Stefan Hau-Riege, Anton Barty, Paul Mirkarimi, Daniel Stearns, Henry Chapman, Donald Sweeney, W. Miles Clift, Eric Gullikson, Moon-Suk Yi

Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.484729

KEYWORDS: Reflectivity, Photomasks, Extreme ultraviolet lithography, Silicon carbide, Multilayers, Carbon, Silicon, Yield improvement, Ion beams, Critical dimension metrology

Read Abstract +

Showing 5 of 18 publications

SPIE Conference Volume | 10 October 2014

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II

SPIE Conference Volume | 16 October 2012

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications

Conference Committee Involvement (2)

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II

18 August 2014 | San Diego, California, United States

X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications

14 August 2012 | San Diego, California, United States

Keywords/Phrases

Search In:

Publication Years