Shuhei Kobayashi
SPIE Involvement:
Author
Area of Expertise:
Lithography , SRAF , Flat panel displays , Photomasks , RET
Publications (1)

Proceedings Article | 12 June 2018 Paper
Shuhei Kobayashi, Koichiro Yoshida, Masayuki Miyoshi, Yutaka Yoshikawa
Proceedings Volume 10807, 1080706 (2018) https://doi.org/10.1117/12.2324654
KEYWORDS: SRAF, Photomasks, Lithography, Resolution enhancement technologies, LCDs, Halftones, Optical proximity correction, Flat panel displays

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