Dr. Saskia N. Biehl
Head of Micro & Sensor Technologies Group at Fraunhofer-IST
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 31 May 2017 Presentation + Paper
Saskia Biehl, Nancy Paetsch, Eike Meyer-Kornblum
Proceedings Volume 10246, 102460O (2017) https://doi.org/10.1117/12.2265694
KEYWORDS: Sensors, Thin films, Temperature metrology, Deposition processes, System integration, Temperature sensors, Chemical elements, Complex systems, Plasma, Physical vapor deposition, Resistance, Carbon, Chromium, Coating, Multilayers

Proceedings Article | 21 May 2015 Paper
Saskia Biehl, Christian Rumposch, Nancy Paetsch
Proceedings Volume 9517, 95170Y (2015) https://doi.org/10.1117/12.2178914
KEYWORDS: Sensors, Thin films, Resistance, Temperature metrology, Carbon, Polymers, Polymeric sensors, Chromium, Aluminum, Silicon

Proceedings Article | 17 May 2013 Paper
Saskia Biehl, Christian Rumposch, Christian Recknagel
Proceedings Volume 8763, 87630D (2013) https://doi.org/10.1117/12.2017374
KEYWORDS: Sensors, Thin films, Carbon, Coating, Spindles, Electrodes, Chromium, Resistance, Silicon, Silicon carbide

Proceedings Article | 19 May 2009 Paper
Saskia Biehl, Sebastian Staufenbiel, Frank Hauschild
Proceedings Volume 7362, 73621J (2009) https://doi.org/10.1117/12.821729
KEYWORDS: Sensors, Thin films, Chromium, Carbon, Resistance, Photomasks, Polishing, Silicon, Silicon carbide, Coating

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