Dr. Sangoh Park
at SAMSUNG Electronics Co., Ltd.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation + Paper
Yeongchan Cho, Seongjeon Choi, Wonchan Lee, Hungbae Ahn, Sangoh Park, Dongho Kim, Seunghune Yang
Proceedings Volume 12953, 129530D (2024) https://doi.org/10.1117/12.3010633
KEYWORDS: Principal component analysis, Photoresist materials, Machine learning, Product development, Optical lithography, Yield improvement, Failure analysis, Design

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