Dr. Robert R. Whiteman
Sr. R&D Engineer at Bookham Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 May 2003 Paper
Robert Whiteman, Andrew Knights, David George, Ian Day, Adrian Vonsovici, Andrew House, G. Hopper, Mehdi Asghari
Proceedings Volume 4997, (2003) https://doi.org/10.1117/12.479466
KEYWORDS: Signal attenuation, Silicon, Waveguides, Absorption, Refractive index, Doping, Modulation, Diffusion, Electrons, Etching

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