Pauline Voisin
at Commissariat à l'Energie Atomique
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 3 May 2007 Paper
P. Voisin, T. Levender, M. Zelsmann, C. Gourgon, J. Boussey
Proceedings Volume 6533, 65331G (2007) https://doi.org/10.1117/12.736537
KEYWORDS: Silica, Silicon, Etching, Nanoimprint lithography, Ultraviolet radiation, Plasma etching, Electron beam lithography, Optical lithography, Thin films, Scanning electron microscopy

Proceedings Article | 15 March 2007 Paper
P. Voisin, A. Jouve, M. Zelsmann, C. Gourgon, J. Boussey
Proceedings Volume 6517, 65172D (2007) https://doi.org/10.1117/12.712032
KEYWORDS: Semiconducting wafers, Polishing, Silica, Scanning electron microscopy, Ultraviolet radiation, Nanoimprint lithography, Etching, Lithography, Photomasks, Microelectronics

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