Prof. Parthasarathi Chakrabarti Profile

Prof. Parthasarathi Chakrabarti

at Indian Institute of Technology (BHU), Varanasi

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Author

Publications (9)

SPIE Journal Paper | 10 October 2020

Mathematical interpretation of wave propagation, standing wave resonance, and absorption in a metasurface absorber

Nilotpal ., Somak Bhattacharyya, Parthasarathi Chakrabarti

OE, Vol. 59, Issue 10, 107102, (October 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.10.107102

KEYWORDS: Dielectrics, Magnetism, Wave propagation, Absorption, Electromagnetic radiation, Dielectric polarization, Mathematical modeling, Wave plates, Optical engineering, Reflectors

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Proceedings Article | 1 March 2019 Paper

Characterization of Mn doped ZnO wrinkle-network nanostructured thin films deposited by sol-gel spin coating technique

Kamal Rudra, Ashutosh Dikshit, Abhishek Singh, Y. Prajapati, P. Chakrabarti

Proceedings Volume 10919, 109192Q (2019) https://doi.org/10.1117/12.2525236

KEYWORDS: Zinc oxide, Manganese, Thin films, Coating, Sol-gels, Transmittance, Doping, Thin film coatings, UV-Vis spectroscopy, Nanostructures, Nanostructured thin films

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Proceedings Article | 26 September 2013 Paper

Fabrication and characterization of nanostructure thin film ZnO Schottky contacts based UV photodetectors

Ghusoon Ali, P. Chakrabarti

Proceedings Volume 8816, 88160H (2013) https://doi.org/10.1117/12.2044921

KEYWORDS: Zinc oxide, Thin films, Ultraviolet radiation, Photodetectors, Nanostructures, Scanning electron microscopy, Diodes, Silicon, UV optics, Quantum efficiency

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Proceedings Article | 28 January 2013 Paper

Fabrication and electrical characterization of Pd/TiO2/n-Si MIS structure using TiO2 film as insulator layer deposited by low temperature arc vapor deposition process

Kumar Shubham, R. Khan, P. Chakrabarti

Proceedings Volume 8760, 876007 (2013) https://doi.org/10.1117/12.2009612

KEYWORDS: Dielectrics, Thin films, Oxides, Annealing, Capacitance, Interfaces, Silicon, Metals, Deposition processes, Titanium dioxide

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Proceedings Article | 15 October 2012 Paper

Fabrication and Characterization of High Mobility Spin-Coated Zinc Oxide Thin Film Transistors

Shaivalini Singh, P. Chakrabarti

Proceedings Volume 8549, 85492H (2012) https://doi.org/10.1117/12.927425

KEYWORDS: Zinc oxide, Sol-gels, Thin films, Transistors, Silica, Scanning electron microscopy, Coating, Silicon, Semiconducting wafers, Absorbance

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Proceedings Article | 22 October 2004 Paper

Fundamental physics and practical realization of mid-infrared photodetectors

Anthony Krier, Parthasarathi Chakrabarti, Honghai Gao, Y. Mao, Xing-Liang Huang, Victor Sherstnev

Proceedings Volume 5564, (2004) https://doi.org/10.1117/12.555684

KEYWORDS: Photodiodes, Sensors, Photodetectors, Indium arsenide, Heterojunctions, Diffusion, Doping, Mid-IR, Absorption, Cladding

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Proceedings Article | 16 June 2004 Paper

Single-HBT-based optical receiver front-end

Parthasarathi Chakrabarti, Pankaj Kalra, Shishir Agrawal

Proceedings Volume 5352, (2004) https://doi.org/10.1117/12.529860

KEYWORDS: Receivers, Photonic integrated circuits, Resistance, Sensors, Transistors, Singular optics, Photodetectors, Integrated optics, Optical amplifiers, Optoelectronics

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SPIE Journal Paper | 1 April 2003

Noise modeling of an InP/InGaAs heterojunction bipolar phototransistor

P. Chakrabarti, Naveen Agrawal, Pankaj Kalra, Shishir Agrawal, Gaurav Gupta

OE, Vol. 42, Issue 04, (April 2003) https://doi.org/10.1117/12.10.1117/1.1557693

KEYWORDS: Signal to noise ratio, Photodetectors, Resistance, Heterojunctions, Receivers, Sensors, Photonic integrated circuits, Phototransistors, Interference (communication), Absorption

SPIE Journal Paper | 1 February 2003

Noise analysis of an optically controlled metal semiconductor field effect transistor at microwave frequencies

P. Chakrabarti, Badri Tiwari, Suman Kumar

OE, Vol. 42, Issue 02, (February 2003) https://doi.org/10.1117/12.10.1117/1.1532332

KEYWORDS: Field effect transistors, Signal to noise ratio, Resistance, Capacitance, Diffusion, Microwave radiation, Instrument modeling, Metals, Semiconductors, Optical engineering

Showing 5 of 9 publications

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