Dr. Olivier Meyer
at European XFEL GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 June 2023 Poster + Paper
I. Klačková, J. Sztuk-Dambietz, H. Graafsma, S. M. Hosseini-Saber, A. Klyuev, T. Laurus, O. Meyer, T. Preston, N. Raab, R. Shayduk, M. Sikorski, S. Stern, C. Strohm, U. Trunk, M. Turcato
Proceedings Volume 12581, 125810Q (2023) https://doi.org/10.1117/12.2666402
KEYWORDS: Equipment, X-rays, Photons, Signal detection, Calibration, Particles, Femtosecond phenomena, Data corrections, Scattering, Pulse signals

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