Dr. Mikhail A. Antimonov
at Univ of Illinois at Chicago
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 14 November 2016 Paper
Ali Khounsary, Anoop Chandrashekarappa, Anthony Llodra, Mikhail Antimonov, Carlo Segre, Sudhakar Nair, Thomas Irving
Proceedings Volume 9963, 99630W (2016) https://doi.org/10.1117/12.2238929
KEYWORDS: Multilayers, Monochromators, Coating, X-rays, Reflectivity, Crystals, Heat flux, Laser crystals, Mirrors, Error analysis

Proceedings Article | 26 August 2015 Paper
M. Antimonov, A. Khounsary, S. Weigand, J. Rix, D. Keane, J. Grudzinski, A. Johnson, Z. Zhou, W. Jansma
Proceedings Volume 9588, 95880F (2015) https://doi.org/10.1117/12.2193680
KEYWORDS: Chromium, X-rays, Temperature metrology, Polymers, Scattering, Data modeling, Finite element methods, Beryllium, 3D modeling, Atmospheric modeling

Proceedings Article | 3 October 2014 Paper
Proceedings Volume 9207, 92070Z (2014) https://doi.org/10.1117/12.2063294
KEYWORDS: Prisms, X-rays, Statistical analysis, Silicon, Colorimetry, X-ray optics, Refractive index, Diffraction, Absorption, Alternate lighting of surfaces

Proceedings Article | 8 October 2013 Paper
Proceedings Volume 8848, 88480A (2013) https://doi.org/10.1117/12.2027722
KEYWORDS: Teeth, Prisms, Lenses, X-rays, Silicon, Chemical elements, Commercial off the shelf technology, Collimation, Manufacturing, Alternate lighting of surfaces

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