Michio Kohno
Senior Engineer at Canon Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 12 July 2006 Paper
Michio Kohno, Kiyoshi Fukami, Hitoshi Yoshioka, Shu Watanabe, Akiyoshi Suzuki
Proceedings Volume 6342, 63420Y (2006) https://doi.org/10.1117/12.692265
KEYWORDS: Mirrors, Projection systems, Combined lens-mirror systems, Aspheric lenses, Photomasks, Optical alignment, Distortion, Wavefront aberrations, Iron, Monochromatic aberrations

Proceedings Article | 26 June 2003 Paper
Hitoshi Nakano, Hideo Hata, Hideki Nogawa, Nobuyoshi Deguchi, Michio Kohno, Yuji Chiba
Proceedings Volume 5040, (2003) https://doi.org/10.1117/12.485509
KEYWORDS: Projection systems, Semiconducting wafers, Oxygen, Reticles, Optical coatings, Transmittance, Birefringence, Crystals, Scanners, Helium

Proceedings Article | 30 July 2002 Paper
Hideki Nogawa, Hideo Hata, Michio Kohno
Proceedings Volume 4691, (2002) https://doi.org/10.1117/12.474609
KEYWORDS: Projection systems, Birefringence, Crystals, Semiconducting wafers, Scanners, Contamination, Wafer-level optics, Reticles, Pellicles, Optical design

Proceedings Article | 8 August 1993 Paper
Michio Kohno, Nobuhiro Kodachi, Kazumi Yajima, Seiya Miura
Proceedings Volume 1927, (1993) https://doi.org/10.1117/12.150453
KEYWORDS: Particles, Reticles, Pellicles, Inspection, Semiconducting wafers, Light scattering, Optical lithography, Opacity, Device simulation, Photoresist materials

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