The THIA instrument is a visible through extended short-wave infrared (SWIR) imaging spectrometer. Designed using a solid block optical system and a single camera, the sensor is extremely compact with low power requirements. The spectrometer, manufactured by Corning, consists of reflective optical and grating surfaces diamond turned onto a single block of CaF2. The system has been flown repeatedly on a Matrice 600 hexacopter and on small aircraft for data collections. It operates from 0.4-2.45 microns, with high throughput due to the fast f/1.5 optics and has a total weight of 2.4 kg. THIA SNR was designed to exceed 100 over the full spectral range from 400 to 2450 nanometers under normal operating conditions and exceed 250 below 1700 nanometers. The first prototype system exhibits degraded throughput below 500 nanometers, but meets the SNR threshold over the rest of the range. Stray light backgrounds in the initial prototype require software correction. Despite these issues, the system has been used to obtain meaningful data. Here we characterize THIA Signal-to-Noise in flight conditions and compare results to predicted and benchtop performance.
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