Electric field measurements based on cross-polarizers technique on crystals showing Pockels effect are nowadays relatively widely used for characterization of detector materials such CdTe, CdZnTe, CdZnTeSe and GaAs. Our present study is focused on nonstandard cases, in which the electrodes have a non-planar geometry, especially strip and single pixel contact with opposite planar electrode. Electric field is simulated using Poisson’s equation and the transmittance distribution of the system consisting of the biased sample (Pockels cell) placed between two orthogonal polarizers is calculated. We compare the simulations with measurements on CdZnTe samples and discuss the limits of the electric field evaluation.
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