Dr. Mark J. Davis
Senior Principal Scientist at SCHOTT North America Inc
SPIE Involvement:
Author | Instructor
Publications (16)

Proceedings Article | 7 March 2019 Presentation + Paper
Proceedings Volume 10896, 108961E (2019) https://doi.org/10.1117/12.2510780
KEYWORDS: Cameras, Glasses, Laser glasses, Silica, Refractive index, Photoelasticity, Polarization, Protactinium, Interferometers, Thermal optics

Proceedings Article | 17 September 2018 Presentation + Paper
Mark Davis, Michaelene Kocher
Proceedings Volume 10745, 107450D (2018) https://doi.org/10.1117/12.2320708
KEYWORDS: Glasses, Fabry–Perot interferometers, Sensors, Solids, Optical design, Chalcogenide glass, Refractive index, Selenium, Temperature metrology, Infrared radiation

Proceedings Article | 21 April 2017 Presentation
Proceedings Volume 10082, 1008208 (2017) https://doi.org/10.1117/12.2252755
KEYWORDS: Defense and security, Retina, Optical fibers, Optical communications, Signal attenuation, Surgery, Erbium, Solid state lasers, Laser applications, Fiber optic communications

Proceedings Article | 16 February 2017 Presentation + Paper
Mark Davis, William James, Gernot Weber, Ralf Jedamzik
Proceedings Volume 10100, 1010016 (2017) https://doi.org/10.1117/12.2257225
KEYWORDS: Glasses, Chalcogenide glass, Near infrared, Long wavelength infrared, Short wave infrared radiation, Mid-IR, Infrared radiation, Refractive index, Arsenic, Transparency, Thermal optics, Absorption, Selenium, Germanium, Temperature metrology

Proceedings Article | 31 October 2014 Paper
Proceedings Volume 9237, 923710 (2014) https://doi.org/10.1117/12.2068076
KEYWORDS: Thermal optics, Finite element methods, Refractive index, Glasses, Laser glasses, Rod lasers, Photoelasticity, Distortion, Adaptive optics, Nd:YAG lasers

Proceedings Article | 18 July 2014 Paper
Proceedings Volume 9151, 91510R (2014) https://doi.org/10.1117/12.2054760
KEYWORDS: Mirrors, Space telescopes, Space mirrors, Radiation effects, Telescopes, Glasses, Ceramics, Zerodur, Etching, Polishing

Proceedings Article | 26 May 2011 Paper
Proceedings Volume 8039, 803910 (2011) https://doi.org/10.1117/12.884173
KEYWORDS: Glasses, Laser glasses, Laser applications, Absorption, Doping, Semiconductor lasers, Mirrors, Neodymium, Power meters, Photodiodes

Proceedings Article | 4 May 2010 Paper
Hong Li, Mark Davis, Eric Urruti
Proceedings Volume 7686, 768616 (2010) https://doi.org/10.1117/12.849659
KEYWORDS: Glasses, Ions, Laser glasses, Erbium, Cerium, Oxides, Absorption, Chromium, Laser development, Ytterbium

Proceedings Article | 22 August 2009 Paper
Thorsten Döhring, Peter Hartmann, Frank-Thomas Lentes, Ralf Jedamzik, Mark Davis
Proceedings Volume 7425, 74250L (2009) https://doi.org/10.1117/12.825263
KEYWORDS: Mirrors, Satellites, Space telescopes, Glasses, Ceramics, X-rays, Telescopes, Space operations, Radiation effects, Space mirrors

Proceedings Article | 12 September 2007 Paper
Mark Davis, Joseph Hayden, Daniel Farber
Proceedings Volume 6673, 66730R (2007) https://doi.org/10.1117/12.734423
KEYWORDS: Fabry–Perot interferometers, Temperature metrology, Zerodur, Mirrors, Rubidium, Glasses, Photodiodes, Control systems, Optical amplifiers, Data modeling

Proceedings Article | 20 May 2004 Paper
Ina Mitra, Jochen Alkemper, Rolf Mueller, Uwe Nolte, Axel Engel, Hrabanus Hack, Heiko Kohlmann, Volker Wittmer, Wolfgang Pannhorst, Mark Davis, Lutz Aschke, Konrad Knapp
Proceedings Volume 5374, (2004) https://doi.org/10.1117/12.535193
KEYWORDS: Zerodur, Surface roughness, Temperature metrology, Extreme ultraviolet lithography, Extreme ultraviolet, Glasses, Metrology, Surface finishing, Refractive index, Crystals

Proceedings Article | 12 December 2003 Paper
Mark Davis, Jakob Fainberg
Proceedings Volume 5179, (2003) https://doi.org/10.1117/12.506839
KEYWORDS: Radiation effects, Zerodur, Finite element methods, Calibration, Silica, Mirrors, Data modeling, Interferometry, Optical testing, Reflectivity

Proceedings Article | 16 June 2003 Paper
Ina Mitra, Jochen Alkemper, Uwe Nolte, Axel Engel, Rolf Mueller, Simone Ritter, Hrabanus Hack, Klaus Megges, Heiko Kohlmann, Wolfgang Pannhorst, Mark Davis, Lutz Aschke, Konrad Knapp
Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.484728
KEYWORDS: Zerodur, Surface roughness, Temperature metrology, Extreme ultraviolet, Metrology, Glasses, Standards development, Extreme ultraviolet lithography, Surface finishing, Crystals

Proceedings Article | 1 July 2002 Paper
Ina Mitra, Mark Davis, Jochen Alkemper, Rolf Mueller, Heiko Kohlmann, Lutz Aschke, Ewald Moersen, Simone Ritter, Hrabanus Hack, Wolfgang Pannhorst
Proceedings Volume 4688, (2002) https://doi.org/10.1117/12.472322
KEYWORDS: Zerodur, Temperature metrology, Glasses, Critical dimension metrology, Extreme ultraviolet lithography, Extreme ultraviolet, Solids, Refractive index, Crystals, Photomasks

Proceedings Article | 2 November 2001 Paper
Samuel Conzone, Mark Davis
Proceedings Volume 4452, (2001) https://doi.org/10.1117/12.446885
KEYWORDS: Zerodur, Sol-gels, Mirrors, Surface finishing, Heat treatments, Polishing, Interfaces, Temperature metrology, Glasses, Optical components

Proceedings Article | 2 November 2001 Paper
Mark Davis, Alexander Marker, Lutz Aschke, Fredi Schubert, Ewald Moersen, Heiko Kohlmann, Ina Mitra, Jochen Alkemper, Rudolf Mueller, John Taylor, Kenneth Blaedel, Scott Hector
Proceedings Volume 4452, (2001) https://doi.org/10.1117/12.446884
KEYWORDS: Zerodur, Extreme ultraviolet lithography, Temperature metrology, Refractive index, Photomasks, Glasses, Polishing, Error analysis, Projection systems, Interferometers

Showing 5 of 16 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 2 November 2001

Conference Committee Involvement (2)
Optical Materials and Structures Technologies
4 August 2003 | San Diego, California, United States
Inorganic Optical Materials III
2 August 2001 | San Diego, CA, United States
Course Instructor
SC1179: Optical Glass – Properties and Application-oriented Specification
Optical glass provides a central function in optical systems: the precisely defined refraction of light with the highest throughput. Large parts of the optical industry depend on this key material. Microscopes, binoculars, cameras, and projectors constitute examples that are unthinkable without optical glass. Their properties, however, differ considerably from those of other technical materials such as metals or plastics. Datasheet values of refractive index extend to five decimal places (e.g. 1.51680) and homogeneity might be specified to even two more digits (e.g. 2x10-7). This extreme precision sets optical glass apart from most other materials. For optical glass users it is important to know facts about its production and properties in order to specify optical elements adequately. Engineering drawing requirements must ensure sound function of the optical system but should do so without over-specifying various attributes which might lead to higher costs, delivery time delay, or even non-availability. Application formats extend from the millimeter range up to about one meter. For small parts, glass properties are usually not expected to be critical. Most properties, however, do not scale up linearly with the sample size. For large lenses and prisms, different scaling laws of glass properties must be taken into consideration in order to obtain suitable quality. For designing and purchasing of optical elements it is very useful to know the technical conditions of producing, post-processing, quality inspection, and application of optical glass. This course provides knowledge about glass types and properties, including definitions, tolerances, and measurement methods. Relevant properties to be discussed include refractive index, dispersion, transmission, homogeneity, striae, stress birefringence. Also covered are production processes and their influences on glass properties, raw glass delivery formats. The course covers specification of lenses and prisms for optical systems according to the international standards ISO 10110 (optical elements) and ISO 12123 (raw optical glass). Finally, availability of optical glasses and restrictions thereof due to technical, economic, and regulatory reasons are covered.
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