Dr. Kirk W. Brown
Applications Engineer
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 June 2003 Paper
Stewart Robertson, Patrick Naulleau, Donna O'Connell, Kevin McDonald, Todd Delano, Kenneth Goldberg, Steven Hansen, Kirk Brown, Robert Brainard
Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.499357
KEYWORDS: Photomasks, Photoresist materials, Extreme ultraviolet lithography, Lithography, Calibration, Data modeling, Diffusion, Modeling, Extreme ultraviolet, Wafer-level optics

Proceedings Article | 24 July 2002 Paper
Gary Taylor, Cheng-Bai Xu, Gary Teng, JoAnne Leonard, Charles Szmanda, William Lawrence, Sassan Nur, Kirk Brown, Al Stephen
Proceedings Volume 4690, (2002) https://doi.org/10.1117/12.474261
KEYWORDS: Absorbance, Polymers, Lithography, Silicon, Etching, Absorption, Plasma etching, Resistance, Reflectivity, Optical lithography

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