Kazuya Hirata
at Sigma Koki Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 February 2011 Paper
Proceedings Volume 7921, 79210M (2011) https://doi.org/10.1117/12.875808
KEYWORDS: Etching, Optical components, Laser damage threshold, Near field optics, Silica, Surface roughness, Glasses, Polishing, Light scattering, Mie scattering

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