The paper presents an analysis of planar broadband waveguide interferometers in the case of a change in layer thickness. The analysis was performed for the wavelength range of 450nm-1200nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the change thickness of the waveguide layers results in a change of the recorded signal shape.
For several decades, microfluidics and related fields have been dynamically developing. For the implementation of structures with a size of several dozen micrometers instead of expensive chrome photomasks, in some cases patterns printed on a typical film by laser printers can be used. The work will compare chrome masks and masks made by laser printers. The structures obtained by the less expensive masks printed on the film will also be presented.
The paper presents an analysis of spectral interference in silicon-on-insulator (SIO) planar waveguide structures. The analysis was performed for the wavelength range of 1540nm-1560nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the propagation conditions results in a change of the recorded signal shape.
In the paper the planar waveguide based on SU-8 polymer were made on 2μm of silica (SiO2) on silicon (Si) substrates in order to obtain base for broadband interferometer. Analysis and calculation of sensitivity for single mode broadband differential interferometer were performed. Paper presents preliminary tests and analysis of such structures. Dilution of SU-8 solution for obtaining thin layer (below 500 nm) followed by elipsometric measurements is presented.
The paper presents the principle of operation of the broad-band difference interferometer in the bimodal waveguide. In the planar bimodal waveguide modes fundamental TE0 and TE1 can be excited for the entire range visible light. During the propagation the difference of the phases between the modes is determined, which is the function of the length of the path of propagation, the difference of effective refractive index (NTE0-NTE1) and the optical wavelength. At the output of this system the spectral distribution of intensity is recorded, the shape of which depends on the value of the refractive index of the cover of the waveguides.
In the paper the planar waveguide based on SU-8 polymer were made on different substrates. As polymer layer Gerseltec SU8 GM1040 and Microchem SU8 2000.5 were used. By using Gerseltec SU8 GM1040 we obtained layer with thickness 950 nm which gave us planar waveguide bimodal structure for λ=633nm. By using Microchem SU8 2000.5 we obtained layer thickness 450 nm which gave us single mode waveguide structure for λ=633nm. As substrate we used 2μm of SiO2 on Si and standard microscope glass (soda-lime glass). Additionally the authors performed measurements for characterization of optical and physical properties of obtained layers. We measured layer thickness by Atomic Force Microscope (AFM) and by ellipsometer. Ellipsometry measurement also gave us refractive indices of waveguide layer and substrate. We also performed measurement of effective refractive index and attenuation of waveguide layers. Additionally we performed SEM measurement for checking layers adhesion.
The paper presents analysis of light intensity distribution and sensitivity in differential interferometer based on bimodal polymer waveguide. Key part is analysis of optimal waveguide layer thickness in structure SiO2/SU-8/H2O for maximum bulk refractive index sensitivity. The paper presents new approach to detecting phase difference between modes through registrations only part of energy propagating in the waveguide. Additionally in this paper the analysis of changes in light distribution when energy in modes is not equal were performed.
The paper presents the principle of the operation of a spectropolarimetric interferometer. In the planar waveguide
orthogonal modes of type TE and TM can be excited for the entire visible light. During the propagation the difference
of the phases between the modes is determined, which is the function of the length of the path of propagation, the
difference of the effective refractive index (NTM-NTE) and the wavelength. At the output of this system the spectral distribution of intensity is recorded, the shape of which depends on the value of the refractive index of the cover of the
waveguides.
The paper presents two methods of determining the planar waveguide birefringence and the measuring stands, which are
used to determine the birefringence of planar waveguide structures. The light is introduced into the waveguide through a
prism coupler. First method uses the measurement of scattered light. The second method uses an immersion coupler. The
most fundamental property of an immersion coupler is the possibility to change fluently the propagation length while
immersing the waveguide with an invariable efficiency of output coupling.
The present work suggests a new method of direct measurements of the difference propagation constants Δβ of orthogonal modes (mode beat) of the same order in planar waveguides. The work also presents a method of determining the difference of propagation constants (mode beat) for different refractive indices of the cover. The developed method is particularly adaptable when the difference of propagation constants along the direction of propagation are changed.
The paper deals with investigations concerning new optical fiber structures type D which may be applied in optical fiber sensors of electric current. These structures have been designed, produced and tested. The results of measurements of the magneto-optical effect and the distribution of mode fields in such optical fibers have been presented, as well as the test stand designed for investigations of magneto-optical phenomena.
The paper is summarizing theoretical and experimental works carried out so far, involving the investigation on the influence of the absorption of the planar waveguide's cover on the attentuation of the guided modes - a phenomenon being a fundamental element for the functioning of optic sensors based on the effect of absorption change of the cover. Theoretical fundamentals of this phenomenon have been discussed, a new measurement method has been presented.
In the paper are presented investigation of planar and channel polarimetric interferometer made by ion exchange in glass for sensor applications. J have determined the dependence of the difference of propagation constants of orthogonal modes of the same order on the refractive index of the cover, for planar waveguides obtained during the ion exchange K+-Na+ in the glass BK-7. Similar measurements have been made for the exchange AgPLU- Na+, determining also for that case the influence of heating time on those parameters.
A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.
In the paper we have determined the dependence of the difference of propagation constants of orthogonal modes of the same order on the refractive index ofthe cover, for planar waveguides obtained during the ion exchange K+-Na+ in the glass BK-7. Similar measurements have been made for the exchange Ag+-Na+, determining also for that case the influence of heating time on those parameters.
This paper presents recent developments in investigations of glass integrated optical circuit. Components are realized by the waveguide technologies: single ion exchange, creating of buried strip waveguides, double ion exchange, doped glass strip waveguides. Equipment and elements on glass planar waveguides and multimode interference structures in the technology of elements of integrated optics.
The present work offers a new method for the direct measurement of the propagation constants difference (Delta) (beta) of orthogonal modes (mode beat) of the same order in planar waveguides. The work also presents the method to determine the difference of propagation constants (mode beat) for different refractive indexes of the cover.
The work presents the interference of modes which have the same polarization states with respect to two successive orders (TE0, TE1) in the planar waveguide obtained with the use of the ion exchange technique K+- Na+ in the base plate made of glass BK-7. The changes of the refractive index of the waveguide cover result in the changes of phase differences between the guided modes, which in turn brings about a different distribution of light intensity at the end of the waveguide.
The work presents the possibility to control the changes involving the difference of the propagation of waveguide modes TE0, TM0, TM1 by respective selection of technological parameters while producing the optics channel of the planar interferometer by ion-exchange technique in glass. The influence of the refractive profile of waveguide structure on the sensitivity of interferometer was observed.
The work presents the structure of a computer-controlled set-up for the measurement of refractive index distribution using the measurement of synchronous angles and the IWKB method. Also, the measurement method of planar waveguide attenuation has been presented. In this method, light decoupling from the waveguide is carried out by means of immersion liquid. It ensures stability of coupling with the waveguide being measured, and furthermore, it enables full automation of the measurement process, as well as its application in the elaboration of measurement results.
The work presents the results of research work on some types of glass in view of their application as material for the production of waveguide structures using the technique of ion exchange Na+--Ag+ and Na+-- K+. In the testing, maximum changes of the refractive index of the glass (Delta) n, caused by the introduction of admixtures in the diffusion and electrodiffusion processes, were determined, as well as diffusion constants and mobility ratios of the exchanged ions.
The work presents the attenuation measurements of planar waveguides produced in the processes of ion exchange Ag+--Na+ and K+--Na+ in the selected types of glass. Also, the influence of waveguide heating on the extent of attenuation has been presented.
The present paper discusses theoretical and experimental research on the planar difference interferometer produced with the use of planar technique on a glass substrate plate (planar interferometers) in view of its application in the system of phase-polarization sensors of basic physical quantities.
The paper presents the results of research on the influence of long-term heating of planar waveguides at a low temperature (427 K), produced as result of ion-exchange K+--Na+ and Ag+--Na+ in chosen types of glasses, on their properties. The changes in the maximum value of a refractive index on the waveguide surfaces as well as diffusion constants for tested types of glasses at heating temperature were defined.
The paper presents a modified method of attenuation measurement in planar optical waveguides using two prism couplers. In this method, the output prism has been replaced with the immersion coupler. The assumed solution ensures the maintenance of constant coupling conditions when leading out the wave from the tested planar waveguide, at the moments when the length of propagation distance in the waveguide undergoes changes. The method enables the attenuation measurement of a selected mode. Furthermore,t he assumed solution makes it possible to automation the measurement process.
The paper presents the results of works on a planar optical amplitude refractometer. On the basis of ion exchange Ag+ - Na+ in glass, channel lightguide sensors are produced. Further on, they will be masked by an appropriate dielectric layer except for a window, where the sample interacts with the waveguide. A planar structure prepared in this way constitutes the basic element of the planar refractometer. Technological and geometric parameters of structures produced influence refractometer transmission characteristics. In the range of lower values of refractive indexes, sensitivity of the refractometer can be increased if the channel waveguide has the shape of a slowly changing sinusoid.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.