Juliane Ratteit
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 September 2005 Paper
Proceedings Volume 5878, 587813 (2005) https://doi.org/10.1117/12.616500
KEYWORDS: Scattering, Light scattering, Mirrors, Multilayers, Optics manufacturing, Autoregressive models, Scatter measurement, Sensors, Interfaces, Atomic force microscopy

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