Dr. Jozef Novák
Head of the Dept of Optoelectronics at Institute of Electrical Engineering SAS
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 30 May 2017 Presentation + Paper
J. Novák, A. Laurenčíková, S. Hasenohrl, P. Eliáš, J. Kováč
Proceedings Volume 10248, 102480E (2017) https://doi.org/10.1117/12.2264797
KEYWORDS: Nanowires, Carbon monoxide, Solar energy, Sun, Sensors, Nanostructuring, Platinum, P-type semiconductors, Semiconductors, Carbon dioxide, Absorption, Electrodes, Nanosensors

Proceedings Article | 30 May 2017 Paper
Ivana Lettrichova, Dusan Pudis, Agata Laurencikova, Peter Gaso, Lubos Suslik, Daniel Jandura, Jozef Novak
Proceedings Volume 10249, 102490T (2017) https://doi.org/10.1117/12.2265815
KEYWORDS: Light emitting diodes, Lithography, Measurement devices, Telecommunications, Sensing systems, Photonic nanostructures, Photoresist materials, Electron beam lithography, Goniophotometry, Scanning electron microscopy, Solids, Diffraction, Optical testing, 3D metrology, Sensors, GRIN lenses

Proceedings Article | 23 December 2016 Paper
Jana Ďurišová, Dušan Pudiš, Agáta Laurenčíková, Jozef Novák, Ľuboš Šušlik
Proceedings Volume 10142, 101421B (2016) https://doi.org/10.1117/12.2263979
KEYWORDS: Nanowires, Reflectivity, Zinc oxide, Sputter deposition, Gold, Polarization, Reflection, Ocean optics, Silicon, Optical testing

Proceedings Article | 23 December 2016 Paper
Ivana Lettrichova, Dusan Pudis, Agata Laurencikova, Peter Gaso, Lubos Suslik, Daniel Jandura, Jana Durisova, Jozef Novak
Proceedings Volume 10142, 101421P (2016) https://doi.org/10.1117/12.2264454
KEYWORDS: Light emitting diodes, Electron beam lithography, Optical properties, Lithography, Goniophotometry, Scanning electron microscopy, Photoresist materials, Reactive ion etching, Distance measurement, Diffraction

Proceedings Article | 5 December 2014 Paper
D. Pudis, J. Skriniarova, I. Lettrichova, A. Laurencikova, A. Bencurova, J. Kovac, J. Novak
Proceedings Volume 9441, 94410P (2014) https://doi.org/10.1117/12.2087168
KEYWORDS: Near field scanning optical microscopy, Light emitting diodes, Lithography, Gold, Electron beam lithography, Near field, Semiconductors, Near field optics, Optical lithography, Photoresist materials

Showing 5 of 9 publications
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