Dr. Josep Nicolàs
at ALBA Synchrotron
SPIE Involvement:
Author
Publications (30)

Proceedings Article | 21 August 2024 Paper
Proceedings Volume 13093, 130934X (2024) https://doi.org/10.1117/12.3017800
KEYWORDS: X-rays, Sensors, Mirrors, Detector arrays, Synchrotrons, Silicon, X-ray optics, Laser soldering, Reflection, Optical alignment

Proceedings Article | 12 July 2023 Open Access Paper
Dominique Heinis, Antonio Carballedo, Carles Colldelram, Guifré Cuni, Núria Valls Vidal, Alejandro Sánchez, Joan Casas, Josep Nicolàs, Maximilien Collon, Giuseppe Vacanti, Michael Krumrey, Ivo Ferreira, Marcos Bavdaz
Proceedings Volume 12777, 1277721 (2023) https://doi.org/10.1117/12.2689958
KEYWORDS: Vacuum chambers, X-rays, Mirrors, Autocollimators, Synchrotrons, Astronomical imaging, Silicon, X-ray characterization, Scintillators, Laser soldering

Proceedings Article | 7 June 2023 Presentation + Paper
A. Van Eeckhout, I. Sics, L. Ribó, C. Colldelram, J. Nicolas
Proceedings Volume 12576, 125760E (2023) https://doi.org/10.1117/12.2665674
KEYWORDS: Fizeau interferometers, Stitching interferometry, Mirrors, Mirror surfaces, Calibration, Optical surfaces

Proceedings Article | 11 June 2021 Open Access Paper
Dominique Heinis, Antonio Carballedo, Carles Colldelram, Guifré Cuní, Núria Valls Vidal, Óscar Matilla, Jordi Marcos, Alejandro Sánchez, Joan Casas, Josep Nicolàs, Nicolas Barrière, Maximilien Collon, Giuseppe Vacanti, Evelyn Handick, Peter Müller, Michael Krumrey, Ivo Ferreira, Marcos Bavdaz
Proceedings Volume 11852, 1185222 (2021) https://doi.org/10.1117/12.2599350

Proceedings Article | 17 October 2018 Paper
Proceedings Volume 10761, 1076106 (2018) https://doi.org/10.1117/12.2323293
KEYWORDS: Mirrors, Metrology, Optical components, Calibration, X-rays, Tolerancing, CCD cameras

Showing 5 of 30 publications
Conference Committee Involvement (7)
Advances in Metrology for X-Ray and EUV Optics XI
3 August 2025 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics X
23 August 2023 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Showing 5 of 7 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top