William J. Hall
Vice President of Engineering at Opto-Alignment Technology Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 March 2024 Presentation + Paper
Proceedings Volume 12913, 1291315 (2024) https://doi.org/10.1117/12.3022748
KEYWORDS: Optical coherence tomography, Sensors, Distance measurement, Reflection, Beam path, Refractive index, Interferometry, Adhesives

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